In March 2020, a brand new training module took place on the EPN campus (ILL–ESRF, Grenoble, France) for 25 students from the Postgraduate School of the Grenoble Alpes University. Designed by the “large-scale instrument characterization program “and the “training program” of the Institute, the module provided PhD students with an overview of different synchrotron and… Lire la suite » ... Read more »
IRT Nanoelec News
On March 13, 2020, IRT Nanoelec hold a webinar workshop “Bridging the gap between semiconductor technologies and architecture” design focussed on 3D integration, Photonics & Cybersecurity. Additional contents to the workshop 13/3/2020 Video here. Introduction IRT Nanoelec at a glance Hugues Metras, IRT Nanoelec, France See Hughes slides About the talk : The presentation will… Lire la suite » ... Read more »
250 participants from 200 companies met in Lyon, on Dec. 12th 2019 for the Annual Meeting of Minalogic, global innovation cluster for digital technologies based Auvergne-Rhône-Alpes region in France and founding member of the IRT Nanoelec. This event aimed at illustrating how the network opens up opportunities for cooperation across traditional boarders of company sizes,… Lire la suite » ... Read more »
The book “Hardware security of systems – Vulnerability of processors and operating techniques” edited in French at Dunod received a literary Award at the European Cyber Week (Nov. 2019, Rennes, France). The authors, Olivier Savry, Thomas Hiscock and Mustapha El Majihi (CEA-Leti), are contributors to the Pulse program of IRT Nanoelec, devoted to digital trust. ... Read more »
Carac 2019
//CARAC is the annual international event dedicated to materials characterization for industry supported by the IRT Nanoelec and the European projects CalipsoPlus, NFFA and SINE2020. CARAC 2019 (November 28th-29th of 2019, Grenoble, France) gathered 60 attendees from the European research scene for presentations of industrial cases, tutorials on advanced characterization techniques and technical visits of… Lire la suite » ... Read more »