Platform for Advanced Characterisation (PAC-G)


PAC-G is a dedicated gateway giving the micro- and nano-electronics industry quick and easy access to some of the world’s most advanced characterisation facilities. We are unique, offering a single, unified access point to large-scale facilities such as synchrotron- and neutron-based sources. This gives us an extremely broad portfolio of individual characterisation techniques, complementary in nature, that we can offer our clients.  Please visite the PAC-G specific website for more information.

Main techniques

  • Synchrotron X-Ray diffraction
  • Fast and thermal neutrons
  • Non-destructive 2D/3D imaging
  • Reflectivity


Advanced Instrumentation


Worldwide expertise



Physical Characterisation

  • Interface inspections
  • Bulk material
  • Wafer analysis

Reliability and failure analysis

  • Non-destructive 2D/3D imaging
  • Radiation Hardness testing

Tailored support by expert