|The unmatched performance of large-scale instruments to perform advanced characterisations of electronic components and devices has to be made known to industrial users. Read more on issues and context of the carac program here|
|Develop a competence center for testing radiation hardness of electronic components.|
|Continue to make unique scientific instruments & methodologies available to serve the new challenges of the electronics industry|
|CEA, CNRS/LPSC, ESRF, ILL, Schneider Electric, Soitec, STMicroelectronics, Iroc Technologie|
Ennio Capria, Director of Nanoelec/Carac program, sheds light on the issues and context of the Nanoelec/Carac program.