[EVENT] 📢 From March 30 to April 1, 2021: IRT Nanoelec (EN), CEA Tech, Inria, and OpenHW Group organize the “2nd RISCV week” as a phygital event (online and at sites : Rennes, Grenoble & Paris-Saclay). More details on : https://open-src-soc.org ! RISC-V is a free and open ISA enabling a new era of processor innovation through open source collaboration…. Lire la suite » ... Read more »
IRT Nanoelec News
STMicroelectronics, Schneider Electric and Lynred presented the first integration of Edge AI in a high-performance people-counting sensor developed in the frame of Nanoelec in November 2020. While monitoring occupancy in large spaces with multiple entrances and exits is a significant challenge in any closed environment, it potentially provides significant value to hotels, offices, retail businesses… Lire la suite » ... Read more »
The startup Kentyou partnered with the Nanoelec/Pulse program in 2020 to enhance its own development to provide a strong capacity to connect sensors, merge and mine data for smart cities. “As far as sensor technologies are affordable and wide spread for now on, city or building operators have to cope with the difficulty to extract… Lire la suite » ... Read more »
In papers presented at IEDM 2020, scientists from Université Grenoble-Alpes, CEA-Leti, STMicroelectronics gathered in Nanoelec/Powergan program, with colleagues of University of Padova (Italy) recounted experiments with variations of high-electron- mobility transistors (HEMT) based on gallium nitride-on-silicon. GaN-based semiconductors improve both performance and reliability of increasingly compact power converters compared to silicon, and AIGaN/GaN HEMTs have… Lire la suite » ... Read more »
The #nanoelec PAC-G is organising by December 9-10, 2020, the G-RAD workshop on facilities and methodologies for radiation testing of electronic devices. The goal is to assess current offer and future needs of the industry. #microelectronics #reliability #radhard #neutrons #xrays Radiation effects in semiconductor devices is one of the major reliability concerns in today’s electronics…. Lire la suite » ... Read more »