The IRT Nanoelec Advanced Characterization Platform organized a partner event during Semicon Europa held on October 6, 2015 in Dresden.
The panel discussion started with a presentation of the IRT Nanoelec Advanced Characterization Platform’s operations and organization and continued with three presentations by partners: The European Materials Characterization Cluster; NFFA, a Horizon 2020 project that kicked off recently and that counts IRT Nanoelec via its partners CEA-Leti and ESRF among the project consortium; and the characterization needs of IBM US’s piezoelectric transistor R&D.
The presence of a panel made up of 25 experts from industrial R&D and academic research ensured that the quality of the discussions aligned with the expectations of the manufacturers present.
Topics that garnered particular interest were the vision and outlook for nanoelectronics-related characterization on the large scientific instruments, with a particular emphasis on users from industrial R&D.