Radiation effects in semiconductor devices have come to play a major role in the performance and reliability of today’s electronics. Several questions also arise from emerging applications (such as self-driving cars, nanosatellites, medical implants etc.). As the demand for radiation hardness testing is on the rise, the availability of radiation facilities providing industrial access to perform these tests at least for certain radiation types are not able to catch up with the increasing demand. Traditional testing methodologies also seem to be limited in face of new semiconductor technologies, the increased usage of commercial components of the shelf and new applications fields.
Building upon the experience, notably linked to the very positive outcome and feedback of the G-RAD workshop in December 2020, the G-RAD(NEXT) workshop in May 2022, the G-RADNEXT workshop 2023 at CERN and the GB-RADNEXT 2024 Workshop at RAL in the UK, we propose you to join us in May 2025 and continue from where we left last year. We are proud to announce that the workshop venue will be at GANIL in Caen, France.
