![](https://irtnanoelec.fr/wp-content/uploads/2021/08/33A1318-1024x683.jpg)
![]() | The unmatched performance of large-scale instruments must be identified by industrial users as a cutting-edge tool to perform advanced characterizations of electronic components and devices. Read more on issues and context of the carac program here |
![]() | Develop a competence center for testing radiation hardness of electronic components. |
![]() | Continue to make unique scientific instruments & methodologies available to meet the new challenges of the electronics industry for the serenity and sovereignty of the digital transition. |
![]() | CEA, CNRS/LPSC, ESRF, ILL, Schneider Electric, Soitec, STMicroelectronics, Iroc Technologies |
![](https://irtnanoelec.fr/wp-content/uploads/2021/08/E.CAPRIA-NANOELEC-©-CEA-PIERRE-JAYET065-1024x722.jpg)
Direct link to PAC-G Plateform