“Multiple-Stacked-Wafer (MSW) technology : the appropriate technology for ultra-low power Smart Sensor” Deputy Director of the IRT Nanoelec/Smart Imager program, sébastien Thuries, will give a talk Design, Automation and Test in Europe Conference (DATE) on 26 march 2024, in the frame of a workshop dedicated to Heterogeneous 3D Architectures and Sensors
