Easy access to large scale instruments for characterization

Large instruments are offering unparalleled performance for advanced characterisation of electronic objects. However, access to these instruments was designed for expert users, which is frequently the case among academic researchers, but less so among industrial users. (c) P.Jayet

	The unmatched performance of large-scale instruments must be identified by industrial users as a cutting-edge tool to perform advanced characterizations of electronic components and devices. Read more on issues and context of the carac program here
	Develop a competence center for testing radiation hardness of electronic components.
	Continue to make unique scientific instruments & methodologies available to meet the new challenges of the electronics industry for the serenity and sovereignty of the digital transition.
	CEA, CNRS/LPSC, ESRF, ILL, Schneider Electric, Soitec, STMicroelectronics, Iroc Technologies

Nanoelec/Characterisation’ program is headed by Ennio Capria, Deputy Head of Business Development at the ESRF (c) P.Jayet/CEA

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