After recent demonstration, in the frame of Nanoelec, of a new, wireless system that offers increased safety, flexibility and productivity gains to the blasting market, CEA-Leti and Davey Bickford Enaex have extended their joint laboratory for three years to continue development of innovative radio-frequency communication systems that remotely control networks of high-tech wireless electronic detonators…. Lire la suite » ... Read more »
IRT Nanoelec News
EV Group, a core partner of Nanoelec consortium, successfully demonstrates end-to-end process flow for collective die-to-wafer bonding with sub-two-micron placement accuracy. This breakthrough represents an important milestone in accelerating the deployment of heterogeneous integration in next-generation 2.5D and 3D semiconductor packaging. Such technologies are requiered for leading-edge applications such as artificial intelligence, autonomous driving, augmented/virtual… Lire la suite » ... Read more »
Carac’20
//Characterization of new electronic components is essential to their design and ultimately to ensure their reliability. The 7th edition of the Carac Symposium took place online on the IRT Nanoelec webinar platform gathering 50 attendees. This edition focused on the performance gains of the very large equipment available under the Nanoelec / Characterization program, at… Lire la suite » ... Read more »
Intel Corporation announced (PRESS RELEASE | 2020.10.27) a new collaboration with CEA-Leti on advanced #3D and packaging technologies for processors to advance chip design. The research will focus on further reducing the size of computer chips, optimizing interconnection technologies between the different elements of #microprocessors, and on new bonding and stacking technologies for silicon #wafers,… Lire la suite » ... Read more »
Radiation effects in semiconductor devices is one of the major reliability concerns in today’s electronics. Continuous scaling and the ubiquitous presence of sensors and components in our day-to-day life have brought these effects to play a main role in the performance of electronic systems. Moreover, several reliability questions arise from new applications (such as self-driving… Lire la suite » ... Read more »