{"id":3048,"date":"2025-07-10T17:36:14","date_gmt":"2025-07-10T15:36:14","guid":{"rendered":"https:\/\/irtnanoelec.fr\/?post_type=programme&p=3048"},"modified":"2026-03-24T15:37:44","modified_gmt":"2026-03-24T14:37:44","slug":"caracterisation-par-les-grands-instruments","status":"publish","type":"programme","link":"https:\/\/irtnanoelec.fr\/en\/programme\/caracterisation-par-les-grands-instruments\/","title":{"rendered":"Easy access to large scale instruments for characterization"},"content":{"rendered":"
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<\/span>Caract\u00e9risation par les grands instruments<\/h2>

Les grands instruments offrent des performances in\u00e9gal\u00e9es pour la caract\u00e9risation avanc\u00e9e des objets \u00e9lectroniques. Cependant, l\u2019acc\u00e8s \u00e0 ces instruments a \u00e9t\u00e9 con\u00e7u pour des utilisateurs experts, ce qui est fr\u00e9quemment le cas chez les chercheurs universitaires, mais moins chez les utilisateurs industriels.<\/p>\n

Gr\u00e2ce au programme Nanoelec\/Characterisation, les entreprises industrielles et les chercheurs ont acc\u00e8s \u00e0 des outils de classe mondiale pour \u00e9tudier les effets des rayonnements ionisants sur les dispositifs et syst\u00e8mes \u00e9lectroniques, caract\u00e9riser les propri\u00e9t\u00e9s de leurs mat\u00e9riaux et inspecter leurs composants, contribuant ainsi \u00e0 la qualit\u00e9 de leurs produits et processus. Gr\u00e2ce au pouvoir de p\u00e9n\u00e9tration \u00e9lev\u00e9 des neutrons et des rayons X synchrotron, ces \u00e9valuations peuvent \u00eatre r\u00e9alis\u00e9es de mani\u00e8re non destructive, sans avoir \u00e0 ouvrir ou endommager les objets, et dans de nombreux cas pendant leur fonctionnement.<\/p>\n<\/div>

\n Rapport public 2025<\/a>Enjeux et contexte du programme<\/a> <\/div>\n <\/div>\n \n \n <\/div>\n <\/div>\n <\/section>\n
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<\/span>PAC-G<\/h2>

Une passerelle vers les instruments \u00e0 grande \u00e9chelle d\u00e9di\u00e9s aux besoins de l’industrie \u00e9lectronique
\nPAC-G offre un point d’acc\u00e8s unique \u00e0 des installations \u00e0 grande \u00e9chelle telles que les sources de rayonnement synchrotron et neutronique gr\u00e2ce \u00e0 un service rapide et \u00e9conomique adapt\u00e9 \u00e0 l’innovation dans le domaine de l’\u00e9lectronique.<\/p>\n

PAC-G offre \u00e0 l’industrie \u00e9lectronique un acc\u00e8s rapide et facile \u00e0 certaines des installations de caract\u00e9risation les plus avanc\u00e9es au monde. Dans le cadre du programme Nanoelec\/Carac, PAC-G propose \u00e9galement un portefeuille extr\u00eamement large de techniques de caract\u00e9risation individuelles mais compl\u00e9mentaires. Un pipeline<\/em> d\u00e9di\u00e9 a \u00e9t\u00e9 mis en place pour garantir que toutes les preuves de concept valid\u00e9es dans le cadre du programme soient transf\u00e9r\u00e9es et adopt\u00e9es avec succ\u00e8s par les partenaires de R&D concern\u00e9s.<\/p>\n<\/div>

\n Plateforme PAC-G<\/a> <\/div>\n <\/div>\n \n \n <\/div>\n <\/div>\n <\/section>\n
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Vision<\/p>\n<\/td>

Les performances in\u00e9gal\u00e9es des instruments \u00e0 grande \u00e9chelle pour effectuer des caract\u00e9risations avanc\u00e9es de composants et dispositifs \u00e9lectroniques doivent \u00eatre connues des utilisateurs industriels. Les enjeux et le contexte du programme sont \u00e0 d\u00e9couvrir\u00a0ici<\/a>.<\/p>\n<\/td><\/tr>

Ambition<\/p>\n<\/td>

D\u00e9velopper un centre de comp\u00e9tences pour tester la r\u00e9sistance des composants \u00e9lectroniques aux rayonnements.<\/p>\n<\/td><\/tr>

Mission<\/p>\n<\/td>

Continuer \u00e0 mettre \u00e0 disposition des instruments scientifiques et des m\u00e9thodologies uniques pour r\u00e9pondre aux nouveaux d\u00e9fis de l\u2019industrie \u00e9lectronique<\/p>\n<\/td><\/tr>

Partenaires<\/p>\n<\/td>

CEA, CNRS\/LPSC, ESRF, ILL, Schneider Electric, Soitec, STMicroelectronics, Iroc Technologie<\/p>\n<\/td><\/tr><\/tbody> <\/table>\n <\/div>\n <\/div>

Vision<\/p>\n<\/div>

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Les performances in\u00e9gal\u00e9es des instruments \u00e0 grande \u00e9chelle pour effectuer des caract\u00e9risations avanc\u00e9es de composants et dispositifs \u00e9lectroniques doivent \u00eatre connues des utilisateurs industriels. Les enjeux et le contexte du programme sont \u00e0 d\u00e9couvrir\u00a0ici<\/a>.<\/p>\n<\/div><\/div><\/div>

<\/div>

Ambition<\/p>\n<\/div>

<\/div><\/div>

D\u00e9velopper un centre de comp\u00e9tences pour tester la r\u00e9sistance des composants \u00e9lectroniques aux rayonnements.<\/p>\n<\/div><\/div><\/div>

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Mission<\/p>\n<\/div>

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Continuer \u00e0 mettre \u00e0 disposition des instruments scientifiques et des m\u00e9thodologies uniques pour r\u00e9pondre aux nouveaux d\u00e9fis de l\u2019industrie \u00e9lectronique<\/p>\n<\/div><\/div><\/div>

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Partenaires<\/p>\n<\/div>

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CEA, CNRS\/LPSC, ESRF, ILL, Schneider Electric, Soitec, STMicroelectronics, Iroc Technologie<\/p>\n<\/div><\/div><\/div>

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Ennio Capria, Directeur adjoint des relations industrielles \u00e0 l’ESRF, dirige le programme Nanoelec\/Caract\u00e9risation (c) P.Jayet\/CEA<\/div> <\/div>\n
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<\/span>Directeur du programme<\/h2> <\/div>\n \n \n <\/div>\n <\/div>\n <\/section>\n","protected":false},"featured_media":0,"template":"","meta":{"_acf_changed":true,"inline_featured_image":false},"class_list":["post-3048","programme","type-programme","status-publish","hentry"],"acf":[],"yoast_head":"\nEasy access to large scale instruments for characterization - IRT Nanoelec<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/irtnanoelec.fr\/en\/programme\/caracterisation-par-les-grands-instruments\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Easy access to large scale instruments for characterization - IRT Nanoelec\" \/>\n<meta property=\"og:url\" content=\"https:\/\/irtnanoelec.fr\/en\/programme\/caracterisation-par-les-grands-instruments\/\" \/>\n<meta property=\"og:site_name\" content=\"IRT Nanoelec\" \/>\n<meta property=\"article:modified_time\" content=\"2026-03-24T14:37:44+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/irtnanoelec.fr\/en\/programme\/caracterisation-par-les-grands-instruments\/\",\"url\":\"https:\/\/irtnanoelec.fr\/en\/programme\/caracterisation-par-les-grands-instruments\/\",\"name\":\"Easy access to large scale instruments for characterization - 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