{"id":2801,"date":"2025-06-16T18:47:38","date_gmt":"2025-06-16T16:47:38","guid":{"rendered":"https:\/\/irtnanoelec.fr\/?page_id=2801"},"modified":"2025-07-16T15:27:21","modified_gmt":"2025-07-16T13:27:21","slug":"easy-access-to-large-scale-instruments-for-characterization","status":"publish","type":"page","link":"https:\/\/irtnanoelec.fr\/en\/easy-access-to-large-scale-instruments-for-characterization\/","title":{"rendered":"Easy access to large scale instruments for characterization"},"content":{"rendered":"\n<p><a href=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2021\/08\/33A1318.jpg\"><\/a><\/p>\n\n\n<section class=\"section-normal push-visuel \">\n    <div class=\"container\">\n        <div class=\"flex flex-column gap-2 items-center\">\n                                <div class=\"relative\">\n                        <img decoding=\"async\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/33A1318.jpg\" alt=\"\" class=\"max-h-800 object-contain\"  loading=\"lazy\" >                                            <\/div>\n                        Large instruments are offering unparalleled performance for advanced characterisation of electronic objects. However, access to these instruments was designed for expert users, which is frequently the case among academic researchers, but less so among industrial users. (c) P.Jayet        <\/div>\n    <\/div>\n<\/section>\n\n    <div class=\"spacer hide-md h-20\"><\/div>\n    <div class=\"spacer hide show-md h-20\"><\/div>\n\n\n<div class=\"container hide-md\">\n        <div class=\"border-neutral-200 overflow-sm-x-scroll border-l border-r. rounded-xl\">\n            <table class=\"min-w-full table-auto mb-0 \"><tbody><tr class=\"border-t border-b border-neutral-200 bg-neutral-light\"><td class=\"w-300  p-4 align-middle whitespace-nowrap\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1596\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/VISION-300x60-1.jpg\" alt=\"\" width=\"300\" height=\"60\" \/><\/p>\n<\/td><td class=\" p-4 align-middle whitespace-nowrap\"><p>The unmatched performance of large-scale instruments must be identified by industrial users as a cutting-edge tool to perform advanced characterizations of electronic components and devices. Read more on issues and context of the carac program\u00a0<a href=\"https:\/\/irtnanoelec.fr\/actualites\/unparalleled-performance-for-advanced-characterisation\/\">here<\/a><\/p>\n<\/td><\/tr><tr class=\"border-b border-neutral-200 \"><td class=\"w-300  p-4 align-middle whitespace-nowrap\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1598\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/AMBITION-300x61-1.jpg\" alt=\"\" width=\"300\" height=\"61\" \/><\/p>\n<\/td><td class=\" p-4 align-middle whitespace-nowrap\"><p>Develop a competence center for testing radiation hardness of electronic components.<\/p>\n<p>&nbsp;<\/p>\n<\/td><\/tr><tr class=\"border-b border-neutral-200 bg-neutral-light\"><td class=\"w-300  p-4 align-middle whitespace-nowrap\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1602\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/MISSION-300x62-1.jpg\" alt=\"\" width=\"300\" height=\"62\" \/><\/p>\n<\/td><td class=\" p-4 align-middle whitespace-nowrap\"><p>Continue to make unique scientific instruments &amp; methodologies available to meet the new challenges of the electronics industry for the serenity and sovereignty of the digital transition.<\/p>\n<\/td><\/tr><tr class=\"border-b border-neutral-200 \"><td class=\"w-300  p-4 align-middle whitespace-nowrap\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1604\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/PARTENAIRES-300x62-1.jpg\" alt=\"\" width=\"300\" height=\"62\" \/><\/p>\n<\/td><td class=\" p-4 align-middle whitespace-nowrap\"><p>CEA, CNRS\/LPSC, ESRF, ILL, Schneider Electric, Soitec, STMicroelectronics, Iroc Technologies<\/p>\n<\/td><\/tr><\/tbody>   <\/table>\n            <\/div>\n        <\/div><div class=\"custom-table-cards container hide block-md \"><div class=\"custom-row bg-neutral-light\"><div class=\"row-header flex flex-wrap px-4 pt-4 pb-0 gap-2\"><div class=\"cell wp-40 flex-1 flex items-center\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1596\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/VISION-300x60-1.jpg\" alt=\"\" width=\"300\" height=\"60\" \/><\/p>\n<\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><\/div><div class=\"row-details mt-2 px-4 pb-4\"><div class=\"detail-row\"><p>The unmatched performance of large-scale instruments must be identified by industrial users as a cutting-edge tool to perform advanced characterizations of electronic components and devices. Read more on issues and context of the carac program\u00a0<a href=\"https:\/\/irtnanoelec.fr\/actualites\/unparalleled-performance-for-advanced-characterisation\/\">here<\/a><\/p>\n<\/div><\/div><\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><div class=\"custom-row \"><div class=\"row-header flex flex-wrap px-4 pt-4 pb-0 gap-2\"><div class=\"cell wp-40 flex-1 flex items-center\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1598\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/AMBITION-300x61-1.jpg\" alt=\"\" width=\"300\" height=\"61\" \/><\/p>\n<\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><\/div><div class=\"row-details mt-2 px-4 pb-4\"><div class=\"detail-row\"><p>Develop a competence center for testing radiation hardness of electronic components.<\/p>\n<p>&nbsp;<\/p>\n<\/div><\/div><\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><div class=\"custom-row bg-neutral-light\"><div class=\"row-header flex flex-wrap px-4 pt-4 pb-0 gap-2\"><div class=\"cell wp-40 flex-1 flex items-center\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1602\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/MISSION-300x62-1.jpg\" alt=\"\" width=\"300\" height=\"62\" \/><\/p>\n<\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><\/div><div class=\"row-details mt-2 px-4 pb-4\"><div class=\"detail-row\"><p>Continue to make unique scientific instruments &amp; methodologies available to meet the new challenges of the electronics industry for the serenity and sovereignty of the digital transition.<\/p>\n<\/div><\/div><\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><div class=\"custom-row \"><div class=\"row-header flex flex-wrap px-4 pt-4 pb-0 gap-2\"><div class=\"cell wp-40 flex-1 flex items-center\"><p><img loading=\"lazy\" decoding=\"async\" class=\"alignnone size-full wp-image-1604\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/PARTENAIRES-300x62-1.jpg\" alt=\"\" width=\"300\" height=\"62\" \/><\/p>\n<\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><\/div><div class=\"row-details mt-2 px-4 pb-4\"><div class=\"detail-row\"><p>CEA, CNRS\/LPSC, ESRF, ILL, Schneider Electric, Soitec, STMicroelectronics, Iroc Technologies<\/p>\n<\/div><\/div><\/div><div class=\"line-gray-h bg-neutral-200\"><\/div><\/div>\n\n    <div class=\"spacer hide-md h-20\"><\/div>\n    <div class=\"spacer hide show-md h-20\"><\/div>\n\n\n<section class=\"section-normal push-visuel \">\n    <div class=\"container\">\n        <div class=\"flex flex-column gap-2 items-center\">\n                                <div class=\"relative\">\n                        <img decoding=\"async\" src=\"https:\/\/irtnanoelec.fr\/wp-content\/uploads\/2025\/06\/E.CAPRIA-NANOELEC-\u00a9-CEA-PIERRE-JAYET065.jpg\" alt=\"\" class=\"max-h-800 object-contain\"  loading=\"lazy\" >                                            <\/div>\n                        Nanoelec\/Characterisation\u2019 program is headed by Ennio Capria, Deputy Head of Business Development at the ESRF (c) P.Jayet\/CEA        <\/div>\n    <\/div>\n<\/section>\n\n\n<div class=\"section-normal push-ctas \">\n    <div class=\"container\">\n                    <div class=\"links-wrap mt-6 gap-4 flex flex-wrap justify-start\">\n                <a href=\"\/pac-g\/\" class=\"bg-brand-default button text-white\" target=\"_blank\">Direct link to<\/a>            <\/div>\n            <\/div>\n<\/div>","protected":false},"excerpt":{"rendered":"","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"specific.php","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":""},"class_list":["post-2801","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.1.1 - 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