{"id":6012,"date":"2026-09-11T08:02:25","date_gmt":"2026-09-11T06:02:25","guid":{"rendered":"https:\/\/irtnanoelec.fr\/?post_type=evenement&#038;p=6012"},"modified":"2026-09-11T10:43:08","modified_gmt":"2026-09-11T08:43:08","slug":"iii-v-laser-sources-for-data-communications-life-cycle-assessment-of-process-fabrication","status":"publish","type":"evenement","link":"https:\/\/irtnanoelec.fr\/en\/evenement\/iii-v-laser-sources-for-data-communications-life-cycle-assessment-of-process-fabrication\/","title":{"rendered":"III-V laser sources for data communications: life cycle assessment of process fabrication"},"content":{"rendered":"    <section class=\" section-normal push-edito \" id=\"block-block_2d5cd62aed9c6308b1e3776b2a2e111b\">\r\n        <div class=\"container\">\r\n            <div class=\"flex gap-6 items-center flex-md-column-reverse\">\r\n                                <div class=\"bg-neutral-0 z-9 flex justify-center flex-column col-sm-12 flex-1\">\r\n                                    <\/div>\r\n                \r\n                   \r\n            <\/div>\r\n        <\/div>\r\n    <\/section>\r\n\n\n    <section class=\" section-block push-edito \" id=\"block-block_814b96fedd3da4abb9275da73d9dee3e\">\r\n        <div class=\"container\">\r\n            <div class=\"flex gap-6 items-center flex-md-column-reverse\">\r\n                                <div class=\"bg-neutral-0 z-9 flex justify-center flex-column col-sm-12 flex-1\">\r\n                    <h2 class=\"heading-m neutral-800 mb-4\"><span class=\"block mb-6 h-4 w-64 bg-brand-lightest\"><\/span>[WEBINAR] III-V laser sources for data communications: life cycle assessment of process fabrication<\/h2><p class=\"description\"><p>Silicon photonics has emerged as a reliable, cost-effective, and CMOS-compatible technology. Silicon exhibits transparency at telecom wavelengths (1.31 and 1.55 \u00b5m) and, due to its high refractive index contrast with silicon oxide, enables the fabrication of high-performance optical components. However, its indirect bandgap hinders the monolithic integration of laser sources, leading to increasing reliance on direct-bandgap III\u2013V materials. Several approaches for integrating lasers on silicon have been developed, but their environmental impacts and the extensive use of III\u2013V materials raise new concerns. This work presents a cradle-to-gate comparative Life Cycle Assessment (LCA) across 16 impact categories of laser fabrication in the CEA-LETI cleanrooms. Variations in the native substrate used for epitaxial growth of the active region are investigated: InP or GaAs substrates\u2014as well as differences in laser architecture: conventional hybrid lasers or membrane lasers and finally: two different types of active region quantum dot and quantum well.\u00a0 Given the exponential growth of AI-driven datacenters and the massive deployment of III-V lasers for optical interconnects, this study provides insights for guiding the industry toward more sustainable large-scale integration of III-V lasers for co-packaged optics.<\/p>\n<h4>Speaker : Elona Fidon :\u00a0<span data-asw-org-font-size=\"16\">Research Engineer\u00a0<\/span><span data-asw-org-font-size=\"16\">III\/V Materials Growth &amp; Sustainable Electronics<br \/>\n<\/span><span data-asw-org-font-size=\"16\">LTM, Univ. Grenoble Alpes, CNRS<\/span><\/h4>\n<\/p>                        <div class=\"links-wrap mt-6 gap-4 flex flex-wrap\">\r\n                            <a href=\"https:\/\/actandmatch100.clickmeeting.com\/iii-v-laser-sources-for-data-communications-life-cycle-assessment-of-process-fabrication\/register\" class=\"bg-brand-default button text-white\" target=\"_blank\" rel=\"noopener\">register here<\/a>                        <\/div>\r\n                                    <\/div>\r\n                \r\n                   \r\n            <\/div>\r\n        <\/div>\r\n    <\/section>\r\n","protected":false},"featured_media":0,"template":"","meta":{"_acf_changed":true,"inline_featured_image":false},"class_list":["post-6012","evenement","type-evenement","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.0 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>III-V laser sources for data communications: life cycle assessment of process fabrication - 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