{"id":2582,"date":"2023-09-14T12:52:00","date_gmt":"2023-09-14T10:52:00","guid":{"rendered":"https:\/\/irtnanoelec.fr\/?post_type=actualite&p=2582"},"modified":"2025-08-01T11:24:09","modified_gmt":"2025-08-01T09:24:09","slug":"workshop-radiation-hardness-testing-of-semiconductor-devices-and-systems","status":"publish","type":"actualite","link":"https:\/\/irtnanoelec.fr\/en\/actualite\/workshop-radiation-hardness-testing-of-semiconductor-devices-and-systems\/","title":{"rendered":"[WORKSHOP] Radiation Hardness Testing of Semiconductor Devices and Systems"},"content":{"rendered":"
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The Workshop for Industry on Radiation Hardness Testing of Semiconductor Devices and Systems at the RADNEXT Facilities<\/p>\n

The 2023 edition of the G-RADNEXT workshop will take place at CERN (Geneva) on November 8th and 9th. It is organized by RADNEXT, the RADECS association and the PAC-G.<\/p>\n

In this workshop we want to give\u00a0young professionals<\/strong>\u00a0in the field of radiation effects on microelectronic and photonic devices the chance to present their work and exchange with their peers as well as with renown experts in the field.<\/p>\n

Therefore,\u00a0Session 2<\/strong>\u00a0of the workshop is entirely dedicated to oral contributions from young professions working in industry or in academia. This session will take place in the afternoon of the first day (November 8th). The oral presentations will last\u00a015 minutes. After the whole session, a Q&A time is reserved for all presentations of the session.<\/p>\n

In addition, a poster session dedicated to young professionals only will be planned.<\/p>\n<\/div> <\/div>\n \n \n <\/div>\n <\/div>\n <\/section>\n\n\n\n

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\n Read more here<\/a> <\/div>\n <\/div>\n<\/div>","protected":false},"featured_media":0,"template":"","meta":{"_acf_changed":true,"inline_featured_image":false},"categories":[],"class_list":["post-2582","actualite","type-actualite","status-publish","hentry"],"acf":[],"yoast_head":"\n[WORKSHOP] Radiation Hardness Testing of Semiconductor Devices and Systems - IRT Nanoelec<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/irtnanoelec.fr\/en\/actualite\/workshop-radiation-hardness-testing-of-semiconductor-devices-and-systems\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"[WORKSHOP] Radiation Hardness Testing of Semiconductor Devices and Systems - IRT Nanoelec\" \/>\n<meta property=\"og:url\" content=\"https:\/\/irtnanoelec.fr\/en\/actualite\/workshop-radiation-hardness-testing-of-semiconductor-devices-and-systems\/\" \/>\n<meta property=\"og:site_name\" content=\"IRT Nanoelec\" \/>\n<meta property=\"article:modified_time\" content=\"2025-08-01T09:24:09+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"2 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/irtnanoelec.fr\/en\/actualite\/workshop-radiation-hardness-testing-of-semiconductor-devices-and-systems\/\",\"url\":\"https:\/\/irtnanoelec.fr\/en\/actualite\/workshop-radiation-hardness-testing-of-semiconductor-devices-and-systems\/\",\"name\":\"[WORKSHOP] Radiation Hardness Testing of Semiconductor Devices and Systems - 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